Low Angle DFL220-30


Price: 850$ + VAT

LUDRE DARK FIELD LIGHT DF25 MACHINE VISION IMAGE PROCESSING LIGHT

TECHNICAL SPECIFICATIONS
Lighting Color: 6000K, Green
Illumination Angle: 30°
Illumination Intensity: 0.225 lm
Number of LEDs: 90
Input Voltage: 24 V
Input Current (15 µs): 2 A
Input Current (1 second): 1,4 A
Input Current (1 minute): 0,7 A
Input Current (continuous): 0,32 A
Dimensions: Rmin = 22 cm, Rmax = 29 cm, h = 3.8 cm
Stable Voltage Operation: No
Diffuser Option: No

Low Angle Illumination is a specialized lighting technique used in image processing projects. This technique provides distinct benefits by directing the light source at a low angle, emphasizing shadows and surface details. The following text describes the use cases and advantages of Low Angle Illumination in image processing projects:

1. Emphasis on Surface Topography: Low Angle Illumination highlights prominent features of excellent surface topography, showcasing elevations and depressions more distinctly.

2. Shadow Details and Contrast Enhancement: Light coming from a low distance accentuates shadows, enhancing surface details, allowing for better distribution, and eliminating contrast.

3. Detection of Surface Defects: Low Angle Illumination helps in better detection of surface defects by emphasizing cleaned-out small cracks, flaws, or other imperfections.

4. Analysis of Heterogeneous Surfaces: This lighting technique is effective in the analysis of solution with heterogeneous surfaces, extraction of different surfaces, and clearing wear and tear.

5. Examination of Structural Features: Low Angle Illumination is used for a more detailed examination of the structural boundaries of an object, which is crucial for material characterization and structural analysis applications.

6. Highlighting Textures: This technique highlights emerging textures, allowing for higher-contrast and distinctly shadowed results to be more visible.

Low Angle Illumination adds valuable information to image processing machines in specific applications, such as details of refraction, shadows, and defects.